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In this research, Cu/Ni multilayer films of the same depth had been prepared by electroplating (EP) and magnetron sputtering (MS), and their particular morphology and crystal construction were described as checking electron microscope (SEM) and transmission electron microscope (TEM). XRD had been made use of to see or watch the crystal structure and measurements of the examples. In addition, the Cu/Ni multilayer film ended up being etched to the shape of a bridge, and the electric surge eve
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