https://www.selleckchem.com/products/cpi-0610.html
Time-of-flight secondary ion mass spectrometry (TOF SIMS) is a well-established mass spectrometry technique used for the chemical analysis of both organic and inorganic materials. In the last ten years, many advances have been made to improve the yield of secondary molecular ions, especially those desorbed from the surfaces of organic samples. For this reason, cluster ion beams with kiloelectron volt energies for the excitation were mostly used. Alternatively, single-ion beams with megaelectron volt energies can be applied, as was done
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