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The macro system created is easily offered. LAY DESCRIPTION Measuring precisely how big nanoclusters plays a crucial role within the research of nanocluster-based product methods. Aberration-corrected checking transmission electron microscopy (STEM) is amongst the most powerful tools to draw out the dimensions of clusters directly from their particular images. In this study, we developed a macro program according to current ImageJ plug-ins, allowing easy-assessment of criteri
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