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Conductance quantization (QC) phenomena occurring in metal oxide based memristors demonstrate great potential for high-density data storage through multilevel switching, and analog synaptic weight update for effective training of the artificial neural networks. Continuous, linear and symmetrical modulation of the device conductance is a critical issue in QC behavior of memristors. In this contribution, we employ the scanning probe microscope (SPM) assisted electrode engineering strategy to control the ion migration process to construct si