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35SMT ceramic.Unverified or counterfeited electronic components pose a big threat globally because they could lead to malfunction of safety-critical systems and reduced reliability of high-hazard assets. The current inspection techniques are either expensive or slow, which becomes the bottleneck of large volume inspection. As a complement of the existing inspection capabilities, a pulsed thermography-based screening technique is proposed in this paper using a digital twin methodology. A FEM-based simulation unit is initially developed to
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