https://www.selleckchem.com/pr....oducts/ku-0060648.ht
Embedded encryption devices and smart sensors are vulnerable to physical attacks. Due to the continuous shrinking of chip size, laser injection, particle radiation and electromagnetic transient injection are possible methods that introduce transient multiple faults. In the fault analysis stage, the adversary is unclear about the actual number of faults injected. Typically, the single-nibble fault analysis encounters difficulties. Therefore, in this paper, we propose novel ciphertext-only impossible differentials that can analyze the
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